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Small Angle X-ray Scattering Measuring Apparatuses

Small Angle X-ray Scattering (SAXS) is a powerful method to investigate the structure of nanomaterials, soft matters, solutions, and many other materials. Two SAXS apparatuses: NANO-Viewer (Fig. 1.) and SAXSess (Fig. 2.) are used in our laboratory. The former targets supercritical fluids, porous materials, and liquid crystals with special sample holder. The latter is specialized in solutions and especially targets ionic liquids. We also use a synchrotron radiation beam at BL-15A Station Photon Factory (PF) at National Laboratory for High Energy Accelerator Research Organization (KEK), Tsukuba. The high intensity of a synchrotron radiation provides quick measurements and extremely high-quality data.

Figure 1. NANO-Viewer (RIGAKU), Focusing multilayer optics + 3 slit, λ= 1.54Å (CuKα), s > 0.07 nm-1

Figure 2. SAXSess (Anton Paar), Focusing multilayer optics + Kratky slit, λ = 1.54Å (CuKα), s > 0.077 nm-1

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